Data augmentation and pre-trained networks for extremely low data regimes unsupervised visual inspection

Published in SPIE Optical Metrology. Proceedings Volume 11787, Automated Visual Inspection and Machine Vision IV, 2021

Recommended citation: Pierre Gutierrez, Antoine Cordier, Thaïs Caldeira, Theophile Sautory (2021): Data augmentation and pre-trained networks for extremely low data regimes unsupervised visual inspection, Proc. SPIE 11787, Automated Visual Inspection and Machine Vision IV, 1178703, DOI: 10.1117/12.2591876. https://arxiv.org/pdf/2106.01277.pdf